A novel methodology based on short run control charts was developed to establish simultaneous intra and inter daily control of instrumental blank samples for trace elements analysis through inductively coupled plasma mass spectrometry (ICP-MS). Eleven inorganic trace elements were analyzed, where chromium was selected to illustrate the methodology. The use of joint control charts, both based on the Quesenberry Q-statistics, revealed to be a suitable tool in detecting possible instrument contaminations as well as evaluating IPC-MS stability.
